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  ATOMIC FORCE MICROSCOPE (AFM) ·        Atomic Force Microscopy (AFM) is a powerful microscopy technique. It is used to acquire high-resolution images at the nanoscale to better understand the properties of matter. ·        The Atomic Force Microscope (AFM) is a type of scanning probe microscope whose primary roles include measuring properties such as magnetism, height and friction. ·        AFM is versatile because it cannot only image in three-dimensional topography, but it also provides various types of surface measurements to the needs of scientists and engineers. ·        Resolution of Atomic Force Microscope (AFM) is 1 nm. ·        AFM can generate images at atomic resolution with Angstrom scale resolution height information, with minimum sample preparation. ·        AFM images can reso...

  SCANNING TUNNELING MICROSCOPY (STM) ·        Scanning Tunneling Microscopy (STM) is a real-space imaging technique, that can produce topographic images of a surface with atomic resolution in all three dimensions. ·        Scanning Tunneling Microscopy (STM) belongs to an expanding family of instruments commonly called Scanning Probe Microscope (SPM). ·        Resolution of Scanning Tunneling Microscopy (STM) is ~0.01 nm. ·        The STM is based on several principles. ü   One is the quantum mechanical effect of Tunneling. It is this effect that allows us to “see” the surface. ü   Another principle is the Piezoelectric effect. It is this effect that allows us to precisely scan the tip with angstrom-level control. ü   Lastly, a Feedback loop is required, which monitors the tunneling current and coordinates the current and the position...